The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2024
Filed:
Aug. 07, 2018
Everix, Inc., Orlando, FL (US);
Esmaeil Banaei, Orlando, FL (US);
Abstract
A thin-film interference filter has a thin-film interference multi-layer stack composed of individual thin-film layers arranged in groups to form a plurality of repeat unit blocks. The thin-film interference filter is flexible enough to be bendable to a radius of curvature of 250 mm or even less without permanently damaging the thin-film interference filter. The thin-film interference filter may have a second thin-film interference multi-layer stack composed of individual thin-film layers arranged in repeat unit blocks may have a different optical transmission spectrum. At least one interlayer between the first thin-film interference multi-layer stack and the second thin-film interference multi-layer stack may block a range of wavelengths of infrared, visible, or ultraviolet light. A defect layer of a different optical thickness than neighboring thin-film layers forming the repeat unit blocks, thereby creating a Fabry Perot resonance cavity.