The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2024
Filed:
Mar. 18, 2019
Applicant:
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Inventor:
Florian Fahrbach, Mannheim, DE;
Assignee:
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 3/14 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G02B 21/006 (2013.01); G02B 3/14 (2013.01); G02B 21/365 (2013.01);
Abstract
A method for manipulating at least one beam path in a microscope includes ascertaining a refractive index of a sample arranged in a sample volume and/or of an optical medium arranged in the sample volume. At least one microscope parameter is set in dependence on the ascertained refractive index for manipulating the beam path.
Fahrbach, Florian. (2024). Method and device for manipulating a beam path in a microscope, method for recording image stacks in a microscope (U.S. Patent No. 11906721). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11906721
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile