The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2024
Filed:
Sep. 02, 2020
Microvision, Inc., Redmond, WA (US);
Ünsal Kabuk, Hamburg, DE;
Microvision, Inc., Redmond, WA (US);
Abstract
A method for optical distance measurement, comprising a creation of at least one frame, including determining 3D information of at least one subregion of a measuring region. A time budget for creating the frame is split between a first phase for assessing at least one region of interest, and a second phase for determining 3D information from the at least one region of interest. During the first phase a plurality of measuring pulses is emitted by a transmitting unit, and reflected measuring pulses are received by a receiving unit, wherein 2D information of the measuring region is determined, wherein at least one region of interest is assessed from the 2D information. During the second phase a plurality of measuring pulses is emitted by a transmitting unit, and reflected measuring pulses are received by the receiving unit, wherein 3D information of the at least one region of interest is determined as part of the second phase.