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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11906610 B1

PDFFull Text
Date of Patent:
Feb. 20, 2024

Filed:

Mar. 10, 2021

Offset calibration and diagnostics for resistance-based bridge circuits

Applicant:

Honeywell International Inc., Charlotte, NC (US);

Inventors:

Ian Bentley, New Ipswich, NH (US);

Richard Bishop, Charlotte, NC (US);

Richard Kirkpatrick, Charlotte, NC (US);

Assignee:

HONEYWELL INTERNATIONAL INC., Charlotte, NC (US);

Attorney:

ALSTON & BIRD LLP

Primary Examiner:

Alexander Satanovsky

Assistant Examiner:

Asm Fakhruddin

Int. Cl.
CPC ...
G01R 35/00 (2006.01); G01R 31/54 (2020.01); G01F 25/10 (2022.01); G01L 27/00 (2006.01); G01N 27/82 (2006.01); G01R 17/10 (2006.01);
U.S. Cl.
CPC ...
G01R 35/007 (2013.01); G01F 25/13 (2022.01); G01L 27/005 (2013.01); G01N 27/82 (2013.01); G01R 17/105 (2013.01); G01R 31/54 (2020.01);
Abstract

Methods, apparatuses and systems for providing offset calibration and fault monitoring are disclosed herein. An example controller component may comprise: a resistance-based bridge circuit; a signal conditioning circuit configured to condition an output of the resistance-based bridge circuit; a first diagnostic circuit coupled to the signal conditioning circuit configured to monitor an output of a first branch of the resistance-based bridge circuit; and a second diagnostic circuit coupled to the signal conditioning circuit configured to monitor an output of a second branch of the resistance-based bridge circuit.

Find Patent Forward Citations

Bentley, Ian. (2024). Offset calibration and diagnostics for resistance-based bridge circuits (U.S. Patent No. 11906610). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11906610

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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