The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2024

Filed:

Jun. 07, 2022
Applicant:

Shanghai University, Shanghai, CN;

Inventors:

Tingyun Wang, Shanghai, CN;

Yi Huang, Shanghai, CN;

Chuanlu Deng, Shanghai, CN;

Chengyong Hu, Shanghai, CN;

Assignee:

Shanghai University, Shanghai, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01D 5/353 (2006.01); G01R 33/032 (2006.01);
U.S. Cl.
CPC ...
G01R 33/032 (2013.01); G01D 5/35329 (2013.01);
Abstract

Disclosed are a system and a method for measuring a magnetorefractive effect of an optical fiber. The system comprises a laser, a coupler A, a sensing optical fiber, a reference optical fiber, a carrier generator, a coupler B, a photoelectric detector and a data acquisition and processing module. The coupler A, the sensing optical fiber, the reference optical fiber and the coupler B form a Mach-Zehnder optical fiber interferometer. An external magnetic field influences the refractive index of the sensing optical fiber, so that the optical path difference between two paths of optical signals in the sensing optical fiber and the reference optical fiber is changed, the intensity of an interference optical signal output by the coupler B is changed, and the refractive index change of the sensing optical fiber under the action of the magnetic field is measured by detecting and processing the interference optical intensity.


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