The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2024
Filed:
Dec. 08, 2021
Applicant:
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Inventors:
Kevin Guo, Singapore, SG;
Hong Jin Kim, Singapore, SG;
Assignee:
ROHDE & SCHWARZ GMBH & CO. KG, Munich, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3183 (2006.01); G01R 31/317 (2006.01); G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318314 (2013.01); G01R 31/31706 (2013.01); G01R 31/31713 (2013.01); G01R 31/318536 (2013.01);
Abstract
The present invention relates to a method for testing a device under test. A component of the device under test generates or receives a bus signal, wherein the bus signal comprises a first data signal or a second data signal, and wherein an amplitude of the first data signal is different from an amplitude of the second data signal. A measurement instrument measures an amplitude of the bus signal. Further, it is determined whether the bus signal comprises the first data signal or the second data signal, based on the measured amplitude of the bus signal.