The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2024
Filed:
Jun. 12, 2019
Electric potential measuring device and method for manufacturing electric potential measuring device
Sony Semiconductor Solutions Corporation, Kanagawa, JP;
Naohiko Kimizuka, Kanagawa, JP;
SONY SEMICONDUCTOR SOLUTIONS CORPORATION, Kanagawa, JP;
Abstract
To provide an electric potential measuring device that can further improve evaluation quality. Provided is an electric potential measuring device including a plurality of readout electrodes arranged in an array form and each configured to detect an electric potential of an action potential generation point generated by an action of a cell, an insulating member, a reference electrode configured to detect a reference potential, and an amplification section configured to obtain a potential difference between a detected electric potential based on the readout electrode and a detected electric potential based on the reference electrode, in which the readout electrode has a covered region where the insulating member is stacked on the readout electrode and an opened region where the insulating member is not stacked on the readout electrode, and the readout electrode has, in the opened region, at least one high portion with high height and/or at least one low portion with low height, with a stacking surface of the readout electrode with the insulating member as a standard.