The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2024
Filed:
Jul. 17, 2019
Fraunhofer-gesellschaft Zur Foerderung Der Angewandten Forschung E.v., Munich, DE;
Michael Jank, Erlangen, DE;
Susanne Oertel, Pettstadt, DE;
Alicia Marion Zoerner, Erlangen, DE;
Wolfgang Thieme, Schwaig, DE;
Thomas Heckel, Erlangen, DE;
Christopher Joffe, Erlangen, DE;
Esther Ann Renner, Erlangen, DE;
Christian Hofmann, Nuremberg, DE;
Nadine Ramona Lang, Erlangen, DE;
Matthias Struck, Nuremberg, DE;
Achim Endruschat, Pilsach, DE;
Holger Gerstner, Erlangen, DE;
Abstract
The invention relates to a system for determining and/or monitoring a state variable of a measurement object comprising an analysis sensor, a control apparatus and a read-out apparatus. The analysis sensor is configured to be introducible into the measurement object for remaining within the same, to be sensitive to an ion type and to generate measurement data based on a concentration of the ion type in the measurement object. The control apparatus controls the analysis sensor with respect to the generation of the measurement data. The read-out apparatus reads the measurement data out of the analysis sensor. Further, the invention relates to a respective method.