The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2024
Filed:
Dec. 21, 2021
Shimadzu Corporation, Kyoto, JP;
Osamu Furuhashi, Kyoto, JP;
Junichi Taniguchi, Kyoto, JP;
SHIMADZU CORPORATION, Kyoto, JP;
Abstract
A mass spectrometer () includes: an ionization section () configured to generate ions from a sample; a mass separation section () configured to separate ions generated by the ionization section according to mass-to-charge ratio; an ion detector () configured to detect an ion separated by the mass separation section; an ion capture section () configured to capture ions separated by the mass separation section; and an electron beam detection section () configured to detect an electron beam diffracted by ions captured within the ion capture section (). This mass spectrometer is capable of performing, in a single measurement operation, both a mass spectrometric analysis and an electron-beam diffraction measurement for distinguishing between isomers. The electron-beam diffraction measurement can be more efficiently performed than in a conventional device of this type.