The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2024

Filed:

Jun. 02, 2023
Applicant:

Green Optics Co., Ltd., Cheongju-si, KR;

Inventors:

Hyun Il Cho, Cheongju-si, KR;

Dong Geun Kim, Cheongju-si, KR;

Kyoung Sang Moon, Cheongju-si, KR;

Jin Ho Kim, Cheongju-si, KR;

Jae Hee Byun, Cheongju-si, KR;

Assignee:

GREEN OPTICS CO., LTD., Cheongju-si, KR;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/95 (2006.01);
U.S. Cl.
CPC ...
G01N 21/9501 (2013.01); G01N 2201/0636 (2013.01);
Abstract

Disclosed is an optical system for imaging, which enables high resolution. An optical system for imaging, which focuses inspection light and monitoring light on an inspection target, includes a dioptric group configured to receive inspection light and monitoring light and to primarily focus the inspection light and the monitoring light on different locations, and a reflection dioptric group configured to reflect and refract the inspection light and the monitoring light that have passed through the dioptric group and to bring the inspection light and the monitoring light into one focus.


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