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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11906442 B1

PDFFull Text
Date of Patent:
Feb. 20, 2024

Filed:

Jun. 21, 2019

Foreign material inspection system of display unit

Applicant:

Lg Chem, Ltd., Seoul, KR;

Inventors:

Beom Seok Lee, Daejeon, KR;

Chan Soo Kim, Daejeon, KR;

Eung Jin Jang, Daejeon, KR;

Sung Hyun Baek, Daejeon, KR;

Yu Jin Lim, Daejeon, KR;

Assignee:

LG CHEM, LTD, Seoul, KR;

Attorney:

BRYAN CAVE LEIGHTON PAISNER LLP

Primary Examiner:

Tri T Ton

Assistant Examiner:

Jarreas Underwood

Int. Cl.
CPC ...
G01N 21/94 (2006.01); G01N 21/55 (2014.01); G01N 21/95 (2006.01); H10K 71/00 (2023.01); H10K 71/70 (2023.01); G02B 5/30 (2006.01);
U.S. Cl.
CPC ...
G01N 21/94 (2013.01); G01N 21/55 (2013.01); G01N 21/95 (2013.01); H10K 71/00 (2023.02); H10K 71/70 (2023.02); G02B 5/3025 (2013.01); G02B 5/3083 (2013.01);
Abstract

An exemplary embodiment of the present invention provides a foreign substance inspection system for a display unit, including: a lighting unit configured to provide incident light to a display unit having an organic light emitting display panel; and a foreign substance detecting unit configured to receive incident light that is reflected by the display unit and detect whether a foreign substance is introduced into the display unit.

Find Patent Forward Citations

Lee, Beom. (2024). Foreign material inspection system of display unit (U.S. Patent No. 11906442). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11906442

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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