The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2024
Filed:
Jun. 03, 2019
Nec Corporation, Tokyo, JP;
Kyota Higa, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
An inspection apparatus () detects an inspection object () from first image data () in which the inspection object () is included. The inspection apparatus () generates second image data () by performing a geometric transform on the first image data () in such a way that a view of the detected inspection object () becomes a view satisfying a predetermined reference. In an inference phase, the inspection apparatus () detects, by using an identification model for detecting an abnormality of the inspection object (), an abnormality of the inspection object () included in the second image data (). Further, in a learning phase, the inspection apparatus () learns, by using the second image data (), an identification model for detecting an abnormality of the inspection object ().