The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2024

Filed:

Sep. 03, 2021
Applicant:

Infineon Technologies Ag, Neubiberg, DE;

Inventors:

Armin Josef Schoenlieb, Seiersberg-Pirka, AT;

Caterina Nahler, Thondorf, AT;

Hannes Plank, Graz, AT;

Assignee:

Infineon Technologies AG, Neubiberg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/55 (2014.01); G01S 17/36 (2006.01);
U.S. Cl.
CPC ...
G01N 21/55 (2013.01); G01S 17/36 (2013.01); G01N 2021/558 (2013.01);
Abstract

A method for determining a reflectivity value indicating a reflectivity of an object is provided. The method includes performing a Time-of-Flight (ToF) measurement using a ToF sensor. A correlation function of the ToF measurement increases over distance within a measurement range of the ToF sensor such that an output value of the ToF sensor for the ToF measurement is independent of the distance between the ToF sensor and the object. The method further includes determining the reflectivity value based on the output value of the ToF sensor for the ToF measurement.


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