The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2024
Filed:
Oct. 01, 2020
Method for identifying chemical and structural variations through terahertz time-domain spectroscopy
Applicant:
The Regents of the University of California, Oakland, CA (US);
Inventors:
Mona Jarrahi, Los Angeles, CA (US);
Nezih Tolga Yardimci, Los Angeles, CA (US);
Assignee:
The Regents of the University of California, Oakland, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/3586 (2014.01); G01J 3/42 (2006.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
G01N 21/3586 (2013.01); G01J 3/42 (2013.01); G01N 21/8851 (2013.01); G01J 2003/423 (2013.01); G01N 2021/8883 (2013.01);
Abstract
A terahertz scanner for detecting irregularities, such as chemical or structural variations, in a sample and methods of use thereof are described. The described terahertz scanner and algorithms allow for direct, high-sensitivity, high-throughput, and non-invasive detection of irregularities that range from chemical contaminant to material defects in a variety of substrates and settings.