The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2024
Filed:
Dec. 28, 2020
Applicant:
Olympus Corporation, Tokyo, JP;
Inventors:
Kazutaka Nishikawa, Tokyo, JP;
Jun Funazaki, Tokyo, JP;
Assignee:
OLYMPUS CORPORATION, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/40 (2006.01); C12Q 1/04 (2006.01); C12Q 1/24 (2006.01); G01N 1/30 (2006.01);
U.S. Cl.
CPC ...
G01N 1/4077 (2013.01); C12Q 1/04 (2013.01); C12Q 1/24 (2013.01); G01N 1/30 (2013.01); G01N 2001/4088 (2013.01);
Abstract
A cell inspection method includes a concentrate production step, a staining step, a cell precipitation step, and an observation step. In the concentrate production step, the cell concentrate is produced by causing an inner cylinder which has a filter provided on a bottom surface to enter from the bottom surface side into the through hole of the outer cylinder and bringing the inner cylinder closer to the slide, the inner cylinder having an internal space, and in the observation step, observation is performed in a state where the inner cylinder is entered into the outer cylinder.