The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2024
Filed:
Sep. 10, 2019
Nippon Telegraph and Telephone Corporation, Tokyo, JP;
NIPPON TELEGRAPH AND TELEPHONE CORPORATION, Tokyo, JP;
Abstract
The purpose of the present disclosure is to provide a mode field diameter test method and test device that enable acquisition of a mode field diameter for an arbitrary higher-order mode. The present disclosure is a mode field diameter test method including: a test light incidence procedure for selectively causing test light to be incident in a mode subject to measurement, on one end of an optical fiberunder test; a far-field pattern measurement procedure for measuring a far-field pattern of the mode subject to measurement, with respect to a divergence angle θ at the other end of the optical fiber under test, by a far-field scanning technique; and a mode field diameter calculation procedure for calculating, using an equation, a mode field diameter from information about incident mode orders in the test light incidence procedure and the far-field pattern measured in the far-field pattern measurement procedure.