The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2024
Filed:
Jun. 03, 2021
Fluke Corporation, Everett, WA (US);
Mohammad Amin Tadayon, Gaithersburg, MD (US);
Kevin R. Williamson, Belgrade, MT (US);
Fluke Corporation, Everett, WA (US);
Abstract
A temperature measurement technology includes generating an input optical signal at a wavelength using an optical signal generator, splitting the input optical signal into a first beam and a second beam, optically transmitting the first beam through the first arm of an interferometer, transmitting the second beam through a second arm of the interferometer that introduces a phase shift in the second beam relative to the first beam, combining at least a portion of the transmitted first beam and the transmitted phase-shifted second beam to produce an output optical signal, measuring an optical signal intensity of the output optical signal, and correlating the measured optical signal intensity with a temperature to produce a measured temperature. Alternatively, the input optical signal may be transmitted through two or more interferometers.