The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2024
Filed:
Jun. 23, 2022
Applicant:
Hand Held Products, Inc., Charlotte, NC (US);
Inventor:
H. Sprague Ackley, Seattle, WA (US);
Assignee:
HAND HELD PRODUCTS, INC., Charlotte, NC (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G01B 11/02 (2006.01); G06T 7/62 (2017.01); G01B 11/00 (2006.01); G06V 30/224 (2022.01); G06F 18/00 (2023.01); G07B 17/00 (2006.01);
U.S. Cl.
CPC ...
G01B 11/02 (2013.01); G01B 11/00 (2013.01); G06F 18/00 (2023.01); G06T 7/62 (2017.01); G06V 30/224 (2022.01); G07B 17/00661 (2013.01);
Abstract
Images of items are evaluated. A first image of the item, having a view of two or more of its surfaces, is captured at a first time. A measurement of at least one dimension of one or more of the surfaces is computed and stored. A second image of the item, having a view of at least one of the two or more surfaces, is captured at a second time, subsequent to the first time. A measurement of the dimension is then computed and compared to the stored first measurement. The computed measurement is evaluated based on the comparison.