The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2024

Filed:

Aug. 15, 2019
Applicant:

Schlumberger Technology Corporation, Sugar Land, TX (US);

Inventors:

Vladimir Zhernakov, Tyumen, RU;

Xiaotong Suo, Stanford, CA (US);

Jose Celaya Galvan, Menlo Park, CA (US);

Velizar Vesselinov, Katy, TX (US);

Neil Holger White Eklund, Oakland, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
E21B 47/022 (2012.01); E21B 44/00 (2006.01); G01V 99/00 (2009.01); E21B 49/00 (2006.01); E21B 41/00 (2006.01);
U.S. Cl.
CPC ...
E21B 47/022 (2013.01); E21B 44/00 (2013.01); G01V 99/005 (2013.01); E21B 41/0092 (2013.01); E21B 49/00 (2013.01);
Abstract

A method for offset well analysis includes receiving offset well data collected from an offset well, the offset well data including data representing a trajectory of an offset well, receiving subject well data comprising a trajectory of at least a portion of a subject well, partitioning the trajectory of the offset well into a plurality of offset well segments, partitioning the trajectory of the subject well into a plurality of subject well segments, determining a distance between at least some of the plurality of offset well segments and at least some of the plurality of subject well segments, selecting the offset well based in part on the distance, and performing an offset well analysis using the offset well and the subject well.


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