The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2024

Filed:

Oct. 27, 2021
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventors:

Hiroki Aoki, Nagano, JP;

Tsuneyuki Sasaki, Matsumoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41M 3/00 (2006.01); B41M 5/00 (2006.01); B41J 3/407 (2006.01); B41J 2/045 (2006.01); G06N 20/00 (2019.01); B41J 3/54 (2006.01);
U.S. Cl.
CPC ...
B41J 3/4078 (2013.01); B41J 2/04541 (2013.01); B41J 3/543 (2013.01); G06N 20/00 (2019.01);
Abstract

An information processing device includes an acquisition unit acquiring image data and status data, a transmission unit transmitting, to a server, the image data and the status data, a reception unit receiving, from the server, first data generated by the server based on the image data and the status data, a storage unit storing the first data received by the reception unit and second data, and a control unit, wherein the first data is data defining a learned model learned by machine learning, the learned model being configured to, when the image data and the status data are input, output fabric data indicating a feature value of the fabric, the second data indicates a correspondence relationship between the fabric data and a recommended parameter, and the control unit derives, based on the first data and the second data, the recommended parameter from the image data and the status data.


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