The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2024

Filed:

Apr. 20, 2022
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventors:

Hirokazu Yanagisawa, Sakata, JP;

Kenichi Ono, Sakata, JP;

Naoki Shishido, Higashitagawa-Gun Shonai-Machi, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B29C 64/106 (2017.01); B29C 64/209 (2017.01); B29C 64/295 (2017.01); B29C 64/35 (2017.01); B33Y 50/02 (2015.01); B29C 64/393 (2017.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01); B29C 64/232 (2017.01);
U.S. Cl.
CPC ...
B29C 64/106 (2017.08); B29C 64/209 (2017.08); B29C 64/232 (2017.08); B29C 64/295 (2017.08); B29C 64/35 (2017.08); B29C 64/393 (2017.08); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12);
Abstract

A three-dimensional modeling device includes a modeling unit having a nozzle configured to eject a modeling material, a stage, a movement mechanism unit for changing a relative position between the nozzle and the stage, a measuring unit, a reference unit having a reference surface arranged at a position that corresponds to a deposition surface of the stage in an intersecting direction and where the reference surface can face the measuring unit, the reference unit being separate from the nozzle, and a control unit controlling the modeling unit and the movement mechanism unit. The control unit controls the measuring unit to measure a first distance between the measuring unit and the reference surface and a second distance between the measuring unit and the distal end surface, and decides a distance between a distal end surface of the nozzle and the deposition surface, based on the first and second distances.


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