The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2024

Filed:

Mar. 07, 2022
Applicants:

Concept Laser Gmbh, Lichtenfels, DE;

Katholieke Universiteit Leuven, Leuven, BE;

Inventors:

Frank Herzog, Lichtenfels, DE;

Florian Bechmann, Lichtenfels, DE;

Sebastian Berumen, Mursbach, DE;

Jean Pierre Kruth, Leuven, BE;

Tom Craeghs, Heverlee, BE;

Assignees:

Concept Laser GmbH, Lichtenfels, DE;

Katholieke Universiteit Leuven, Leuven, BE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B23K 31/12 (2006.01); B33Y 40/00 (2020.01); B33Y 30/00 (2015.01); B29C 64/153 (2017.01); B22F 10/28 (2021.01); B22F 12/90 (2021.01); B23K 26/70 (2014.01); B23K 26/0622 (2014.01); B33Y 10/00 (2015.01); B29C 64/386 (2017.01); B22F 10/31 (2021.01); B22F 10/00 (2021.01); B22F 12/44 (2021.01); B22F 12/49 (2021.01); B22F 10/10 (2021.01);
U.S. Cl.
CPC ...
B23K 31/12 (2013.01); B22F 10/00 (2021.01); B22F 10/28 (2021.01); B22F 10/31 (2021.01); B22F 12/90 (2021.01); B23K 26/0622 (2015.10); B23K 26/705 (2015.10); B23K 31/125 (2013.01); B29C 64/153 (2017.08); B29C 64/386 (2017.08); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 40/00 (2014.12); B22F 10/10 (2021.01); B22F 12/44 (2021.01); B22F 12/49 (2021.01); Y02P 10/25 (2015.11);
Abstract

Sensor values captured by a sensor device are determined, one or more regions of a three-dimensional component having a deviation from an intended value are determined based at least in part on build coordinates for additively manufacturing the three-dimensional component corresponding to the sensor values, and a quality of the three-dimensional component is evaluated based at least in part on the one or more regions of the three-dimensional component having a deviation from the intended value. The sensor values correspond to an electromagnetic spectrum emitted by a melt pool formed by exposing a powder bed to a beam of radiation emitted from a laser apparatus, with the beam of radiation generating the melt pool in a melt region of the powder bed.


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