The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2024

Filed:

Apr. 15, 2019
Applicant:

Topcon Corporation, Tokyo, JP;

Inventor:

Yusuke Ono, Tokyo, JP;

Assignee:

TOPCON CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01); G06K 9/78 (2006.01); G06T 7/00 (2017.01); G06T 7/70 (2017.01); A61B 3/00 (2006.01);
U.S. Cl.
CPC ...
A61B 3/102 (2013.01); A61B 3/0025 (2013.01); G06T 7/0012 (2013.01); G06T 7/70 (2017.01); G06T 2207/10101 (2013.01); G06T 2207/30041 (2013.01); G06T 2207/30168 (2013.01); G06V 2201/03 (2022.01);
Abstract

An ophthalmic apparatus of an embodiment example applies an OCT scan to an anterior segment and constructs an image from acquired data. Further, the ophthalmic apparatus analyzes the image to detect an artifact along an A-scan direction and moves an OCT optical system based on the artifact. Also, the ophthalmic apparatus analyzes the image to detect a corneal image and judges whether an intersection between the artifact and the corneal image is located within a predetermined area. In addition, the ophthalmic apparatus calculates an image quality evaluation value of the image, and controls the OCT optical system to perform an OCT scan of a predetermined pattern if the intersection is located within the area and the image quality evaluation value is equal to or greater than a predetermined threshold.


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