The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2024

Filed:

Nov. 28, 2022
Applicant:

Samsung Display Co., Ltd., Yongin-si, KR;

Inventors:

Seung-lyong Bok, Hwaseong-si, KR;

Kicheol Kim, Yongin-si, KR;

DongHo Lee, Seoul, KR;

Assignee:

Samsung Display Co., Ltd., Yongin-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 1/22 (2006.01); H10K 59/00 (2023.01); G01K 7/18 (2006.01); H10K 59/88 (2023.01); H10K 59/131 (2023.01); H10K 50/844 (2023.01); H10K 59/122 (2023.01);
U.S. Cl.
CPC ...
H10K 59/00 (2023.02); G01K 7/183 (2013.01); G01L 1/2293 (2013.01); H10K 59/131 (2023.02); H10K 59/88 (2023.02); H10K 50/844 (2023.02); H10K 59/122 (2023.02);
Abstract

An electronic device includes: a base substrate including an active region, which includes a sensing region, and a peripheral region adjacent to the active region; an input sensor including a sensing insulating layer, a plurality of first sensing electrodes, a plurality of second sensing electrodes, the second sensing electrodes being spaced apart from the first sensing electrodes; and a pressure sensor including a plurality of strain sensing patterns overlapping the sensing region, and strain connection patterns connecting the strain sensing patterns to each other, wherein each of the first sensing electrodes comprises a plurality of first sensing patterns overlapping the active region, each of the second sensing electrodes comprises a plurality of second sensing patterns overlapping the active region and on a same layer as the first sensing patterns, and a plurality of second connection patterns connecting the second sensing patterns.


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