The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2024

Filed:

Feb. 15, 2023
Applicant:

Phoenix Neutron Imaging Llc, Monona, WI (US);

Inventors:

Ross Radel, Madison, WI (US);

Tye Gribb, Fitchburg, WI (US);

Assignee:

PHOENIX NEUTRON IMAGING LLC, Monona, WI (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H05H 6/00 (2006.01); H05H 3/06 (2006.01);
U.S. Cl.
CPC ...
H05H 6/00 (2013.01); H05H 3/06 (2013.01);
Abstract

Provided herein are systems, devices, articles of manufacture, and methods for generating neutrons employing a high energy ion beam target (HEM target) and a target backing configured to be in contact with the bottom surface of the HEIB target (e.g., to generate an ion beam target assembly). In certain embodiments, the HEM target has a thickness that is less than the penetration depth of protons or deuterons in the high energy ion beam that strikes the target. In certain embodiments, the target backing comprises a high hydrogen diffusion metal (e.g., palladium), has open spaces dispersed throughout for reduced proton diffusion distances, and has a shape and thickness such that all, or virtually all, of the protons or deuterons that pass through the HEIB target are stopped. Also provided herein are systems, devices, and methods for changing targets in an ion beam accelerator system.


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