The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2024
Filed:
Dec. 02, 2019
Applicant:
Arm Limited, Cambridge, GB;
Inventors:
Vasileios Laganakos, Cambridge, GB;
Irenéus Johannes De Jong, Cambridge, GB;
Assignee:
Arm Limited, Cambridge, GB;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/271 (2018.01); H04N 23/67 (2023.01); H04N 13/00 (2018.01);
U.S. Cl.
CPC ...
H04N 13/271 (2018.05); H04N 23/675 (2023.01); H04N 2013/0081 (2013.01);
Abstract
A method comprising the steps of obtaining image data captured at an image sensor using a focus configuration. A distance is determined for one or more objects in the image data, based on the focus configuration and a sharpness characteristic of the image data of the object. A depth map is then generated based on the determined distance.
Laganakos, Vasileios. (2024). Depth measurement (U.S. Patent No. 11902497). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11902497
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