The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2024

Filed:

Jul. 14, 2022
Applicant:

Canon Solutions America, Inc., Melville, NY (US);

Inventor:

Jeffrey David Kane, Boynton Beach, FL (US);

Assignee:

Canon Solutions America, Inc., Melville, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/00 (2006.01);
U.S. Cl.
CPC ...
H04N 1/00344 (2013.01);
Abstract

Devices, systems, and methods obtain sensor data that were generated by a plurality of sensors; obtain event data that include occurrences of an event; calculate first characteristics of the sensor data that were generated by the plurality of sensors within a temporal range of an occurrence of the event; identify, in the sensor data, sensor data that were generated by the plurality of sensors within the temporal range of at least one other occurrence of the event based on the first characteristics; calculate second characteristics of the sensor data that were generated by the plurality of sensors within the temporal range of the at least one other occurrence of the event, normalize at least some of the sensor data based on the first characteristics and on the second characteristics, thereby generating normalized sensor data, and train a machine-learning model based on the normalized sensor data.


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