The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2024
Filed:
Jun. 25, 2021
Amazon Technologies, Inc., Reno, NV (US);
Vijayan Nagarajan, Plano, TX (US);
Lisa Harrington Waygood, Bainbridge Island, WA (US);
Siddharth Krishnamurthy, Seattle, WA (US);
Amazon Technologies, Inc., Reno, NV (US);
Abstract
Historical time-series data can be analyzed using a probabilistic model to determine one or more distributions, including at least a normal distribution and an anomaly distribution. These distributions can be analyzed to obtain values for distribution parameters, such as mean, standard deviation, and density, as well as other statistical parameters, for use in building a forecasting model. This model can analyze the time-series data to predict or forecast actionable anomalies at one or more future points or periods in time, such as may exceed a determined anomaly threshold with at least a minimum amount of confidence. A determination can be made as to one or more actions to take in anticipation of the anomalous event, or volume of events, such as to attempt to prevent the occurrence or to be better positioned to handle the occurrence. Such forecasting or prediction can utilize both modeling and feature engineering.