The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2024
Filed:
Nov. 04, 2020
Applicant:
National Instruments Corporation, Austin, TX (US);
Inventors:
Gerardo Orozco Valdes, Austin, TX (US);
Dong Chen, Shanghai, CN;
Assignee:
National Instruments Corporation, Austin, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
H01Q 21/24 (2006.01); H01Q 13/24 (2006.01); H04B 3/56 (2006.01); H01Q 13/28 (2006.01); H01Q 1/24 (2006.01);
U.S. Cl.
CPC ...
H01Q 21/24 (2013.01); H01Q 1/246 (2013.01); H01Q 13/24 (2013.01); H01Q 13/28 (2013.01); H04B 3/56 (2013.01);
Abstract
Methods, apparatuses, and systems for verifying alignment of a compact antenna test range (CATR) are presented. A radio frequency (RF) profile may be generated based on test signals received by a reference antenna at a plurality of orientations. Phase and amplitude data of the RF profile may be used to determine whether the CATR is aligned properly.
Orozco Valdes, Gerardo. (2024). Compact antenna test range (catr) alignment verification (U.S. Patent No. 11901636). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11901636
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile