The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2024

Filed:

Dec. 03, 2021
Applicant:

Seagate Technology Llc, Fremont, CA (US);

Inventors:

Stacey Secatch, Niwot, CO (US);

Jonathan Henze, Savage, MN (US);

Assignee:

Seagate Technology LLC, Fremont, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/26 (2006.01); G11C 16/10 (2006.01); G11C 16/14 (2006.01); G11C 16/30 (2006.01); G11C 29/44 (2006.01);
U.S. Cl.
CPC ...
G11C 16/102 (2013.01); G11C 16/14 (2013.01); G11C 16/26 (2013.01); G11C 16/30 (2013.01); G11C 29/4401 (2013.01); G11C 2207/2254 (2013.01);
Abstract

Method and apparatus for managing data in a non-volatile memory (NVM) of a storage device, such as a solid-state drive (SSD). Data are stored to and retrieved from a group of memory cells in the NVM using a controller circuit. The data are retrieved using a first set of read voltages which are applied to the respective memory cells. The first set of read voltages are accumulated into a history distribution, which is evaluated to arrive at a second set of read voltages based upon characteristics of the history distribution. A calibration operation is performed on the memory cells using the second set of read voltages as a starting point. A final, third set of read voltages is obtained during the calibration operation to provide error rate performance at an acceptable level. The third set of read voltages are thereafter used for subsequent read operations.


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