The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2024
Filed:
Nov. 25, 2020
Objectvideo Labs, Llc, Tysons, VA (US);
Jangwon Lee, Tysons, VA (US);
Gang Qian, McLean, VA (US);
Allison Beach, Leesburg, VA (US);
Donald Gerard Madden, Columbia, MD (US);
ObjectVideo Labs, LLC, Tysons, VA (US);
Abstract
Methods and systems for image-based abnormal event detection are disclosed. An example method includes obtaining a sequential set of images captured by a camera; generating a set of observed features for each of the images; generating a set of predicted features based on a portion of the sets of observed features that excludes the set of observed features for a last image in the sequential set of images; determining that a difference between the set of predicted features and the set of observed features for the last image in the sequential set of images satisfies abnormal event criteria; and in response to determining that the difference between the set of predicted features and the set of observed features for the last image in the sequential set of images satisfies abnormal event criteria, classifying the set of sequential images as showing an abnormal event.