The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2024

Filed:

Sep. 22, 2020
Applicant:

Future Dial, Inc., Sunnyvale, CA (US);

Inventors:

Yan Zhou, Mountain View, CA (US);

Jisheng Li, Los Altos, CA (US);

George Huang, Los Altos Hills, CA (US);

Chen Chen, San Ramon, CA (US);

Assignee:

Future Dial, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/70 (2017.01); G06T 7/10 (2017.01); G06T 7/00 (2017.01); G06Q 10/30 (2023.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G06Q 10/30 (2013.01); G06T 2207/30108 (2013.01);
Abstract

A system for cosmetic inspection of a test object is disclosed that includes a movable platform for receiving a test object. The movable platform is capable of positioning the test object within a dome. A plurality of cameras arranged oriented to capture different views of a plurality of surfaces of the test object. A plurality lights arranged are outside the dome, the plurality of lights selectively enabled or disabled according to which of the plurality of surfaces of the test object is to be captured.


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