The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2024

Filed:

Apr. 06, 2020
Applicant:

The Boeing Company, Chicago, IL (US);

Inventors:

Brittany A. Friedland, Seattle, WA (US);

John R. Palmer, Seattle, WA (US);

Lucas Aviles, Everett, WA (US);

Anthony T. O'Hare, Everett, WA (US);

Leanne Jensen, Everett, WA (US);

Raluca M. Dumitrache, Everett, WA (US);

Assignee:

The Boeing Company, Arlington, VA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06Q 10/101 (2023.01); G06Q 10/0639 (2023.01); G06F 30/17 (2020.01); G06F 30/12 (2020.01); G06Q 10/0631 (2023.01);
U.S. Cl.
CPC ...
G06Q 10/101 (2013.01); G06F 30/12 (2020.01); G06F 30/17 (2020.01); G06Q 10/06316 (2013.01); G06Q 10/06395 (2013.01);
Abstract

A computer-implemented method includes receiving process information that specifies one or more process requirements and one or more potential causes of failures associated with processes for manufacturing a design, ii) control information that specifies one or more parameters and one or more values associated with the one or more parameters that facilitate determining whether the one or more process requirements specified in the process information that are associated with the processes are being met, and iii) sensor data associated with the one or more parameters from one or more sensors of a product development environment. Responsive to determining that sensor data associated with a particular parameter of the control information is outside of an associated range of values, a process requirement and a process associated with the parameter is determined based on the process information and the control information.


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