The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2024

Filed:

Jul. 17, 2019
Applicant:

Visa International Service Association, San Francisco, CA (US);

Inventors:

Yuran Zhou, San Mateo, CA (US);

Melissa Lawu Tran, Milpitas, CA (US);

Lawson Lau, Palo Alto, CA (US);

Assignee:

Visa International Service Association, San Francisco, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 20/20 (2019.01); G06F 16/906 (2019.01); G06F 16/35 (2019.01);
U.S. Cl.
CPC ...
G06N 20/20 (2019.01); G06F 16/35 (2019.01); G06F 16/906 (2019.01);
Abstract

A method for identifying subpopulations may include receiving interaction data associated with interactions from a population of individuals. The interaction data may include a plurality of features. A first subpopulation may be identified based on at least one feature of interaction data of each individual. A second subpopulation may include all individuals other than the first subpopulation. The first subpopulation may be clustered into a first plurality of clusters based on the features. A first subset of features may be determined based on the first clusters. The first subpopulation may be clustered into a second plurality of clusters based on the first subset of features. A range for each feature of a second subset of features may be determined based on the second clusters. A subset of the second subpopulation may be determined based on interaction data for each individual and the range for each feature of the second subset of features.


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