The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2024

Filed:

Mar. 04, 2019
Applicant:

Merck Sharp & Dohme Llc, Rahway, NJ (US);

Inventors:

Roberto Irizarry, Wayne, PA (US);

Antong Chen, Blue Bell, PA (US);

Daniel Skomski, Yardley, PA (US);

Assignee:

Merck Sharp & Dohme LLC, Rahway, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/20 (2020.01);
U.S. Cl.
CPC ...
G06F 30/20 (2020.01);
Abstract

Embodiments disclosed herein relate to a model for predicting the release profile of a controlled release device. The implant modeling system and models disclosed herein allow the accurate prediction of a release profile for a controlled release device based on features extracted from micro-resolution imagery. The models combine microstructural features that can be extracted at the XRCT resolution, including pore volume and connectivity, using erosion-dilation image analysis. This strategy allows prediction of release curves of the controlled release device using XRCT despite its resolution limitations.


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