The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2024

Filed:

Mar. 01, 2018
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Kazuhiko Isoyama, Tokyo, JP;

Yoshiaki Sakae, Tokyo, JP;

Jun Nishioka, Tokyo, JP;

Etsuko Ichihara, Tokyo, JP;

Kosuke Yoshida, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/56 (2013.01);
U.S. Cl.
CPC ...
G06F 21/566 (2013.01); G06F 2221/034 (2013.01);
Abstract

An information processing apparatus () classifies each event that occurred in a target apparatus to be determined () either as an event (event of a first class) that also occurs in a standard apparatus () or as an event (event of a second class) that does not occur in the standard apparatus (). Herein, a first model used for a determination with respect to an event that also occurs in the standard apparatus () and a second model used for a determination with respect to an event that does not occur in the standard apparatus () are used as models for determining whether an event that occurs in a target apparatus to be determined () is a target for warning. The information processing apparatus () performs learning of the first model using an event of the first class. Further, the information processing apparatus () performs learning of the second model using an event of the second class.


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