The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2024
Filed:
Aug. 24, 2021
Honeywell International Inc., Charlotte, NC (US);
Honeywell International Inc., Charlotte, NC (US);
Abstract
A method of integrity monitoring for visual odometry comprises capturing a first image at a first time epoch with stereo vision sensors, capturing a second image at a second time epoch, and extracting features from the images. A temporal feature matching process is performed to match the extracted features, using a feature mismatching limiting discriminator. A range, or depth, recovery process is performed to provide stereo feature matching between two images taken by the stereo vision sensors at the same time epoch, using a range error limiting discriminator. An outlier rejection process is performed using a modified RANSAC technique to limit feature moving events. Feature error magnitude and fault probabilities are characterized using overbounding Gaussian models. A state vector estimation process with integrity check is performed using solution separation to determine changes in rotation and translation between images, determine error statistics, detect faults, and compute protection level or integrity risk.