The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2024

Filed:

Dec. 18, 2018
Applicant:

Ebm-papst Landshut Gmbh, Landshut, DE;

Inventors:

Frank Kutschbach, Westerkappeln, DE;

Franz Riedmueller, Attenhofen, DE;

Stephan Wald, Altenberge, DE;

Markus Weingart, Rottenburg, DE;

Anton Berghammer, Attenhofen, DE;

Robert Goldner, Landshut, DE;

Erich Greiner, Schalkham, DE;

Volker Kleine, Bissendorf, DE;

Assignee:

ebm-papst Landshut GmbH, Landshut, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/00 (2006.01); G05B 19/4063 (2006.01); G01P 21/00 (2006.01); G05B 19/39 (2006.01);
U.S. Cl.
CPC ...
G05B 19/4063 (2013.01); G01P 21/00 (2013.01); G05B 19/39 (2013.01); G05B 2219/34484 (2013.01);
Abstract

The invention relates to a method for checking a time-discrete signal value of a sensor for freedom from errors, wherein the signal value of the sensor is converted into a first measured value and a second measured value by two different evaluating devices of an electronic system, wherein the first and second measured values are transmitted to a control system by the electronic system, and the control system calculates a first control signal from the first measured value and, in parallel thereto, a second control signal from the second measured value, wherein the control system comprises a comparator which compares the first control signal and second control signal to verify the identity thereof.


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