The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2024

Filed:

May. 10, 2019
Applicant:

Trumpf Laser-und Systemtechnik Gmbh, Ditzingen, DE;

Inventors:

Matthias Allenberg-Rabe, Stuttgart, DE;

Jürgen Ortmann, Attendorn, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 19/401 (2006.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01); B33Y 50/02 (2015.01); B23K 26/082 (2014.01); B23K 26/354 (2014.01); B23K 26/34 (2014.01); B23K 26/342 (2014.01); G02B 26/10 (2006.01); B29C 64/268 (2017.01); B29C 64/153 (2017.01); B22F 10/31 (2021.01); B22F 12/49 (2021.01); G01S 5/16 (2006.01); G02B 5/122 (2006.01); G02B 27/62 (2006.01); G02B 7/00 (2021.01); B22F 10/28 (2021.01); B22F 12/41 (2021.01); B22F 12/44 (2021.01);
U.S. Cl.
CPC ...
G05B 19/401 (2013.01); B22F 10/31 (2021.01); B22F 12/49 (2021.01); B23K 26/082 (2015.10); B23K 26/34 (2013.01); B23K 26/342 (2015.10); B23K 26/354 (2015.10); B29C 64/153 (2017.08); B29C 64/268 (2017.08); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12); G02B 26/101 (2013.01); B22F 10/28 (2021.01); B22F 12/41 (2021.01); B22F 12/44 (2021.01); B22F 2998/10 (2013.01); B22F 2999/00 (2013.01); G01S 5/16 (2013.01); G02B 5/122 (2013.01); G02B 7/003 (2013.01); G02B 27/62 (2013.01); G05B 2219/49018 (2013.01); Y02P 10/25 (2015.11);
Abstract

The present disclosure relates to calibrating scanner devices for positioning laser beams in a processing field, and includes, e.g.: arranging a retroreflector in the processing field of the scanner device, the processing field being formed in a processing chamber for irradiating powder layers; detecting laser radiation reflected back into the scanner device when the laser beam passes over the retroreflector; determining an actual position of the laser beam in the processing field using the detected laser radiation; and calibrating the scanner device by correcting a laser beam target position specified for the scanner device in the processing field using the determined actual position of the laser beam in the processing field.


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