The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2024
Filed:
Aug. 16, 2019
Applicant:
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Inventors:
Yassen Stefanov Mikhailov, Starnberg, DE;
Steffen Neidhardt, Dorfen, DE;
Assignee:
Rohde & Schwarz GmbH & Co. KG, Munich, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 13/89 (2006.01); G01S 13/935 (2020.01); G01C 21/00 (2006.01); H01Q 3/26 (2006.01); G01S 7/28 (2006.01); G01S 13/02 (2006.01); H01Q 3/36 (2006.01);
U.S. Cl.
CPC ...
G01S 13/89 (2013.01); G01C 21/005 (2013.01); G01S 13/935 (2020.01); H01Q 3/267 (2013.01); G01S 7/2813 (2013.01); G01S 2013/0254 (2013.01); H01Q 3/36 (2013.01);
Abstract
A system for testing a radar under test is provided. The system comprises an antenna array with a plurality of antenna elements, a plurality of transceivers downstream to the plurality of antenna elements and a processing unit. In this context, the processing unit is configured to communicate the radar under test by transmitting and/or receiving a two dimensional test pattern and to compare the two dimensional test pattern with a reference pattern.