The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2024

Filed:

Jul. 23, 2020
Applicant:

Shanghai Jiao Tong University, Shanghai, CN;

Inventors:

Ke Ma, Shanghai, CN;

Shan Jiang, Shanghai, CN;

Enyi Li, Shanghai, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H02M 3/155 (2006.01); H02M 1/00 (2006.01); G01R 31/34 (2020.01); H02M 7/483 (2007.01);
U.S. Cl.
CPC ...
G01R 31/34 (2013.01); H02M 1/0009 (2021.05); H02M 3/155 (2013.01);
Abstract

A testing circuit for multiple SMs of a cascaded converter and a control method thereof are provided. A current generator generates a testing current flowing into a testing module group. The testing module group includes two series-connected testing arms that each contains multiple SMs, or in an alternative way, the testing module group is composed of one or multiple testing units connected in series, and each testing unit includes two testing SMs connected in series reversely. The testing circuit the control method thereof realizes a mission profile emulation of the multiple SMs of the cascaded converter in both inverting and rectifying modes simultaneously to improve a test efficiency. A reverse series connection structure of the two testing SMs offsets a DC component in a capacitor voltage to reduce a power supply voltage required for a test. Dynamic and static control methods under different modulations for the test circuit are provided.


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