The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2024

Filed:

Jan. 03, 2022
Applicant:

Teng-jen Yang, Taichung, TW;

Inventor:

Teng-Jen Yang, Taichung, TW;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/56 (2006.01); A43B 5/00 (2022.01); B25J 19/02 (2006.01); G01N 3/06 (2006.01);
U.S. Cl.
CPC ...
G01N 3/56 (2013.01); A43B 5/00 (2013.01); B25J 19/02 (2013.01); G01N 3/062 (2013.01);
Abstract

A test system with detection feedback works with a robot to which a test object is attached. The test system includes a server and a force sensor disposed to the robot. The server controls the robot to drive the test object to contact a test platform while the force sensor detects at least one reaction force on the test object to generate a sensing feedback signal for the server. When the reaction force corresponding to a direction and indicated by the sensing feedback signal does not match a force setting value, the server adjusts a level to which the robot drives the test object to move relative to the test platform so that the reaction force corresponding to the direction can match the force setting value. Therefore, the resistance acting on the test object moving relative to the test platform may be automatically maintained at the preset degree.


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