The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2024
Filed:
Aug. 24, 2021
Kabushiki Kaisha Toshiba, Tokyo, JP;
Toshiba Infrastructure Systems & Solutions Corporation, Kawasaki, JP;
Yutaka Nakai, Yokohama Kanagawa, JP;
Tomio Ono, Yokohama Kanagawa, JP;
Noriko Yamamoto, Yokohama Kanagawa, JP;
Kazuhiro Itsumi, Tokyo, JP;
KABUSHIKI KAISHA TOSHIBA, Tokyo, JP;
TOSHIBA INFRASTRUCTURE SYSTEMS & SOLUTIONS CORPORATION, Kawasaki, JP;
Abstract
According to one embodiment, an inspection device includes a transmitter configured to transmit a first ultrasonic wave, a receiver on which the first ultrasonic wave is incident, and a receiving-side waveguide located between the receiver and an inspection position. The receiver is configured to output a signal corresponding to the incident first ultrasonic wave. The inspection position is between the transmitter and the receiver. The first ultrasonic wave passes through the receiving-side waveguide. An inspection object passes through the inspection position along a second direction crossing a first direction. The first direction is from the transmitter toward the receiver. The receiving-side waveguide includes at least one of a first structure or a second structure. In the first structure, the receiving-side waveguide includes a tubular member and an inner member. The inner member is located inside the tubular member. In the second structure, the receiving-side waveguide includes a tubular member.