The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2024
Filed:
Jun. 24, 2020
Sms Group Gmbh, Düsseldorf, DE;
Ims Messsysteme Gmbh, Heiligenhaus, DE;
Christian Klinkenberg, Herdecke, DE;
Ulrich Sommers, Düsseldorf, DE;
Helmut Klein, Osterode, DE;
Alexandre Lhoest, Eupen, BE;
Olivier Pensis, Montegnee, BE;
Horst Krauthäuser, Heiligenhaus, DE;
SMS group GmbH, Dusseldorf, DE;
IMS Messsysteme GmbH, Heiligenhaus, DE;
Abstract
A method and a device for determining the material properties of a polycrystalline, in particular metallic, product during production or quality control of the polycrystalline, in particular metallic, product by means of X-ray diffraction using at least one X-ray source and at least one X-ray detector. In this case, an X-ray generated by the X-ray source is directed onto a surface of the polycrystalline product and the resulting diffraction image of the X-ray is recorded by the X-ray detector. After exiting the X-ray source, the X-ray is passed through an X-ray mirror, wherein the X-ray is both monochromatized and focused, by the X-ray mirror, in the direction of the polycrystalline product and/or the X-ray detector, and then reaches a surface of the metallic product.