The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2024
Filed:
Aug. 18, 2021
Canon Kabushiki Kaisha, Tokyo, JP;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
This invention provides a processing apparatus for determining a state of secular change of a deformation of a construction, comprising a selection unit that selects, as a target for determination of secular change, at least a portion of deformations from among a plurality of deformations included in a first image at a first time period, on the basis of at least one of information relating to deformations, information relating to the construction, user selection, or a shape and a relative positional relationship of two or more deformations; a first determination unit that determines a deformation corresponding to a selected deformation among a plurality of deformations included in a second image at a second time period; and a second determination unit that determines a state of secular change between a selected deformation and a deformation determined by the first determination unit.