The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2024

Filed:

Aug. 09, 2019
Applicant:

Sony Corporation, Tokyo, JP;

Inventor:

Yasunobu Kato, Tokyo, JP;

Assignee:

SONY CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/14 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1434 (2013.01); G01N 15/1404 (2013.01); G01N 2015/149 (2013.01);
Abstract

Provided is a microparticle measuring apparatus including a plurality of light detection sections that detects, at different positions, optical information emitted from microparticles flowing through a flow channel. The microparticle measuring apparatus further includes a detection timing control section that controls a detection timing of each light detection section, on the basis of a trigger signal detected at a first reference channel provided in a first light detection section, and an optical signal detected at a second reference channel provided in a second light detection section that detects optical information emitted from the microparticles, at a position different from a position of the first light detection section.


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