The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2024
Filed:
Aug. 30, 2022
Applicant:
Palantir Technologies Inc., Palo Alto, CA (US);
Inventor:
Ethan Bond, New York, NY (US);
Assignee:
Palantir Technologies Inc., Denver, CO (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/2457 (2019.01); G06F 16/25 (2019.01); G06F 3/0481 (2022.01); G06F 3/0484 (2022.01); G01F 1/7084 (2022.01); G01M 3/28 (2006.01); E03B 7/07 (2006.01); G01M 3/00 (2006.01); G01M 3/24 (2006.01);
U.S. Cl.
CPC ...
G01F 1/7084 (2013.01); E03B 7/071 (2013.01); G01M 3/002 (2013.01); G01M 3/007 (2013.01); G01M 3/243 (2013.01); G01M 3/2815 (2013.01); G06F 3/0481 (2013.01); G06F 3/0484 (2013.01); G06F 16/24578 (2019.01); G06F 16/252 (2019.01);
Abstract
The systems and methods described herein provide highly dynamic and interactive data analysis user interfaces which enable the data analyst to quickly and efficiently explore large volume data sources, such as computer code or intellectual system. A user interface can be implanted that includes a plurality of nodes associated with portions of a process. The nodes may include indications of logical relationships between nodes. Node identifiers may be associated with particular nodes and be usable to select particular nodes. Reliability scores associated with particular nodes can be included.