The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2024
Filed:
Feb. 19, 2021
Applicant:
Topcon Positioning Systems, Inc., Livermore, CA (US);
Inventor:
Leonid Valerianovich Edelman, Moscow, RU;
Assignee:
Topcon Positioning Systems, Inc., Livermore, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 3/08 (2006.01); G01C 15/06 (2006.01);
U.S. Cl.
CPC ...
G01C 3/08 (2013.01); G01C 15/06 (2013.01);
Abstract
An optical measurement system and method that utilizes a single camera in combination with a specially configured target object which significantly improves optical measuring accuracy with respect to the measurement of distance, height difference and position.
Edelman, Leonid. (2024). Method and apparatus for single camera optical measurements (U.S. Patent No. 11898875). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11898875
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile