The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2024

Filed:

Oct. 14, 2019
Applicant:

Commissariat a L'energie Atomique ET Aux Energies Alternatives, Paris, FR;

Inventors:

Michel Cardoso, Boulogne-Billancourt, FR;

Thomas Desrez, Palaiseau, FR;

Sebastien Bey, Bullion, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/02 (2006.01); G01B 11/00 (2006.01); G01B 5/016 (2006.01); G06V 10/24 (2022.01); G06V 20/52 (2022.01);
U.S. Cl.
CPC ...
G01B 11/002 (2013.01); G01B 5/016 (2013.01); G01B 11/007 (2013.01); G06V 10/245 (2022.01); G06V 20/52 (2022.01);
Abstract

A method for configuring a device for non-destructive testing of a mechanical part, the device including an optical motion-tracking system, a non-destructive testing probe fixedly linked to a first rigid body, and a pointing device, includes steps of: learning of an origin and of axes of an examination area of the surface of the mechanical part using the pointing device, in a coordinate system linked to the optical motion-tracking system, so as to define a coordinate system linked to the examination area, learning of an origin and of axes of an emitter and receiver surface, called active surface, of the probe using the pointing device, in a coordinate system linked to the first rigid body of the probe, and determination of the position and of the orientation of the active surface of the probe, in the coordinate system linked to the examination area.


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