The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2024
Filed:
Sep. 08, 2020
Huaqiao University, Fujian, CN;
Philipp Kapranov, Fujian, CN;
Huifen Cao, Fujian, CN;
Lorena Salazar-García, Fujian, CN;
Fan Gao, Fujian, CN;
Dongyang Xu, Fujian, CN;
Ye Cai, Fujian, CN;
Xueer Han, Fujian, CN;
Fang Wang, Fujian, CN;
Lu Tang, Fujian, CN;
Huaqiao University, Fujian, CN;
Abstract
The present disclosure discloses a method for detecting single strand breaks (SSBs) in DNA based on the following steps. First, DNA of interest is fragmented with a method that generates 3′ ends that cannot be tailed. Second, the available 3′ ends of the fragmented DNA corresponding to the pre-existing breaks are tailed. Third, SSBs are captured and their positions are identified genome-wide based on the following steps: (1) the tailed fragments are linearly amplified using a chimeric 5′-DNA-RNA-3′ primer; (2) the products of primer extension are tailed at the 3′ ends; (3) the desired products are amplified by PCR with oligonucleotides containing Illumina® adaptor sequences complementary to both tails and subjected to next-generation sequencing (NGS); 4) finally, positions of SSBs are revealed through the analysis of sequencing results.